Journal Articles|Published: 2023
A method to determine the M2 beam quality from the electric field in a single plane
Griessmann M H, Martinez-Becerril A C, Lundeen J S
Optics Continuum(2023)1833 - 1848
Citation
Griessmann, M. H., Martinez-Becerril, A. C., & Lundeen, J. S. (2023). A method to determine the M2 beam quality from the electric field in a single plane. Optics Continuum, 2(8), 1833–1848. https://doi.org/10.1364/OPTCON.494610
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